25 Infos zu Andre Poock
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- Malschwitz
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- GLOBALFOUNDRIES
- Patent
- Cyrus Tabery
- Inventors
- Kaustuve Bhattacharyya
- Lithography
- Thomas
1 Aktuelle Nachrichten
4 Hobbys & Interessen
Andre Poock - Patents... Poock patents. Recent bibliographic sampling of Andre Poock patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title): ...
Wolfram Grundke - PatentsMask defects, such as crystal growth defects and the like, may be efficiently detected and estimated at an early stage of their development by generating test images of the mask under consideration and inspecting the images on the basis of wafer inspection techniques in order to identify repeatedly occurring defects.... Inventors: Uwe Griebenow, Martin Mazur, Wolfram Grundke, Andre Poock · Globalfoundries Inc. Archived* (*May have duplicates - we are upgrading ...
Globalfoundries Inc patent inventors (2012)Inventors on Globalfoundries Inc patents (2012) ... Note: Some Globalfoundries Inc-related inventors may appear under alternate organization ... Andre Poock.
Martin Mazur - PatentsInventors: Uwe Griebenow, Martin Mazur, Wolfram Grundke, Andre Poock · Globalfoundries Inc. Archived* (*May have duplicates - we are upgrading our archive ...
1 Business-Profile
patentbuddy: Andre PoockGLOBALFOUNDRIES INC., Malschwitz, DE
4 Dokumente
P‐6.1: Review of Mask Haze in TFT ManufacturingWileyvon CY Yang · — 4Brian J. Grenon, Kaustuve Bhattacharyya, William Volk, Khoi Phan, Andre Poock, Reticle Surface Contaminants and Their Relationship to ...
Symposium C: MRS Fall Meeting (PDF)brycejardine.comAndre Poock l. , Uwe Knappe l. , Torsten. Fahr', Astrid Gettel' and Wolfram Grundke'; 'Strategic Lithography,. Advanced Micro Devices, Sunnyvale, ...
OPC hotspot identification challenges: ORC vs. PWQ on wafer,...Andre Poock, Sarah McGowan, Francois Weisbuch. AMD, Saxony LLC & Co. KG. Guido Schnasse, Rajesh Ghaskadvi. KLA-Tencor Corporation, San Jose, USA.
Spring04 crystal growthSpring Yield Management Solutions32 Introduction Sub-pellicle reticle contamination was first reported by Grenon et al.1 as a major concern in high volume...
1 Wissenschaftliche Publikationen
Shadow Patents and Patent Applications (Class )JustiaType: Grant. Filed: April 3, Date of Patent: July 12, Assignee: Globalfoundries Inc. Inventors: Andre Poock, Jan Hoentschel ...
1 Allgemeine Veröffentlichungen
Andre Poock - spie.orgSPIE Profile of Andre Poock, GLOBALFOUNDRIES Dresden Module Two. SPIE Profiles is a networking platform for optics and photonics professionals.
13 Webfunde aus dem Netz
Semiconductor device including asymmetric lightly doped ...GoogleUS A Andre Poock Reducing implant degradation in tilted implantations by shifting implantation masks.
Andre Poock's research worksAndre Poock's 9 research works with 43 citations and 2,295 reads, including: Mask parameter variation in the context of the overall variation budget of an advanced logic wafer Fab Andre Poock's ...
Optimal mask characterization by Surrogate Wafer Print ...Academia.eduAndre Poock, Stephanie Maelzer, Chris Spence, Cyrus Tabery, Michael Lang, Guido Schnasse, Milko Peikert, and Kaustuve Bhattacharyya, Wafer Fab Mask ...
Use of layout automation and design-based metrology for ...SPIE Digital Libraryvon C Spence · — Chris Spence, Cyrus Tabery, Andre Poock, Arndt C. Duerr, Thomas Witte, Jan Fiebig, and Jan Heumann "Use of layout automation and design-based metrology for ... von BJ Grenon · · Zitiert von: 28 — Andre Poock, "Reticle surface contaminants and their relationship to sub- pellicle defect formation," Proc. SPIE 5375, Metrology, Inspection, and.
2007 Design Automation And Test In2007 design automation and test in
Übersicht Vereine - StartseiteWestlausitzer FussballverbandJugendleiter: Andre Poock Mobil: [0152] Schiedsrichterobmann: Thomas Schuster Telefon: [ ]
光学邻近校正技术和版图热点管理技术研究cglhub.comAndre Poock, S.M., Francois Weisbuch, OPC hotspot identification challenges: ORC vs. PWQ on wafer. SPIE, Vol.7122:p Y.
ACLV-analysis in production and its impact on product performanceSPIE Digital Library Proceedings
Photomask. Mask effects for high-na EUV: impact of NA,...2 Editorial This is not your father s photomask Tom Faure, IBM Corporation During a ... Paul W. Ackmann, GLOBALFOUNDRIES Inc. International Chair Naoya Cyrus Tabery, Andre Poock *, Arndt C. Duerr #, Thomas Witte #, Jan Fiebig # ...
Method and System for Excursion Monitoring in Optical Lithography...Assignees: GLOBALFOUNDRIES INC. IPC8 Class: USPC Class: Patent applications by Andre Poock, Malschwitz DE
METHOD OF DETECTING REPEATING DEFECTS IN LITHOGRAPHY MASKS ON THE...Patent application title: METHOD OF DETECTING REPEATING DEFECTS IN LITHOGRAPHY MASKS ON THE BASIS OF TEST SUBSTRATES EXPOSED UNDER VARYING CONDITIONS. Inventors: Uwe Griebenow Martin Mazur Wolfram Grundke Andre Poock Agents: WILLIAMS, MORGAN & AMERSON
VOLUME 6 ISSUE 1 SPRING $5.00 US - PDF Free Download... Incorporated William Volk and Kaustuve Bhattacharyya, KLA-Tencor Corporation Andre Poock, AMD Saxony Crystal growth and haze formation on reticles ...
Bedeutung zum Vornamen Andre
Männlicher Vorname (Englisch): Andre; der Männliche, der Tapfere; Altgriechisch (Neues Testament); andreios = mannhaft, tapfer; bekannt durch den hl. Andreas, Apostel, Bruder von Petrus
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