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Axel Buerke - PatentsArchived* (*May have duplicates - we are upgrading our archive.) Fabrication method for an integrated circuit structure ### The bibliographic ...
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Xing: Axel BuerkeStaff Engineer / Dresden / ALD, Risikoanalyse (FMEA), PVD, Prozess-Ingenieur / , PTG Transfergesellschaft, Qimonda Dresden GmbH & Co. OHG
patentbuddy: Axel BuerkeINFINEON TECHNOLOGIES AG
5 Dokumente
Condensed Matter authors/titles Jan (625 skipped)... Petra Majewski, Jan B. Philipp, Ralf Symanczyk, Thomas Happ, Christian Arndt, Mirko Vogt, Roy Zimmermann, Axel Buerke, Andrew P. Graham, Michael Kund.
Abstracts: Materialprfung published by Hanser Verlag, Mnchen... Axel Buerke, Horst Wendrock, Alexander von Glasow : Measuring of Electrical Signals in Integrated Microelectronic Circuits by means of Scanning Probe ...
[ ] Carbon Based Resistive MemoryAuthors: Franz Kreupl, Rainer Bruchhaus, Petra Majewski, Jan B. Philipp, Ralf Symanczyk, Thomas Happ, Christian Arndt, Mirko Vogt, Roy Zimmermann, Axel Buerke,
Electromigration Causes Interconnect Damages - ,,In situ" Observation...Electromigration Causes Interconnect Damages - ,,In situ" Observation in a Scanning Electron Microscope ... Klaus Wetzig, Axel Buerke, Horst Wendrock, Alexander von ...
1 Wissenschaftliche Publikationen
US Patent Application for Fabrication method for an integrated...Publication Date: May 29, Inventors: Clemens Fitz (Dresden), Axel Buerke (Dresden), Jens Hahn (Dresden), Frank Jakubowski (Dresden), Tobias Mono ( Dresden), Joern Regul (Egmating), Sven Schmidbauer (Dresden) Application Number: ...
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US B1 - Semiconductor device and method of manufacture thereof...In order to realize a dual gate CMOS semiconductor device with little leakage of boron that makes it possible to divisionally doping a p-type impurity...
US B1 - Method for forming gate electrodes of semiconductor...US *, 1 Dec 2003, 5 Aug 2004, Axel Buerke, Low resistance barrier for a microelectronic component and method for fabricating the same. US *, 29 May 2003, 2 Dec 2004, Sunpil Youn, Semiconductor structure having low resistance and method of manufacturing same. US *, 13 Oct ...
au:Buerke_A in:cond-mat - SciRate Search@misc{ , author = {Franz Kreupl, Rainer Bruchhaus, Petra Majewski, Jan B.~Philipp, Ralf Symanczyk, Thomas Happ, Christian Arndt, Mirko Vogt, Roy ...
- JanaGanaManaFranz Kreupl Rainer Bruchhaus Petra Majewski Jan B. Philipp Ralf Symanczyk Thomas Happ Christian Arndt Mirko Vogt Roy Zimmermann Axel Buerke Andrew ...
2008 IEEE International Electron Devices Meeting (IEDM) San...... Christian Arndt, Mirko Vogt, Roy Zimmermann, Axel Buerke, Andrew P. Graham, Michael Kund High-Frequency Effects in Carbon Nanotube Interconnects and Implications for On-Chip Inductor Design Hong Li, Kaustav Banerjee Scaling and Variability Analysis of CNT-Based NEMS Devices and Circuits with Implications ...
US A1 - Method for controlling a thickness of a first layer...A method for controlling a thickness of a first layer of an electrical contact of a semiconductor device, whereby the semiconductor device comprises a...
US B2 - Heat resistant ohmic electrode and method of...US *, 1 Dec 2003, 5 Aug 2004, Axel Buerke, Low resistance barrier for a microelectronic component and method for fabricating ...
DE A1 - Measuring system used for micro-characterization of...Erfinder, Hans-Dietrich Bauer, Horst Wendrock, Axel Buerke. Antragsteller, Dresden Ev Inst Festkoerper. Zitat exportieren, BiBTeX, EndNote, RefMan.
Interface optimization for poly silicon/tungsten gates - [PDF...ng nk man DW rem rfor is th mat sed e m hig s drive s at lit a rete er con functi ughou w gate to the underlying n-/p-poly-Si a good interface control with...
Use This Reverse Phone Lookup for (Rio Linda, California), Axel Buerke - Hust Ln, Rio Linda, California , Matilde Lopezmartinez - Bummer St, Rio Linda, California , Zhara ...
au:Kreupl_F in:cond-mat - SciRate Search... Mirko Vogt and Roy Zimmermann and Axel Buerke and Andrew P.~Graham and Michael Kund}, title = {{C}arbon {B}ased {R}esistive {M}emory}, year = {2009}, ...
EP A3 - Process for the manufacture of a wiring for contact...Inventors, Axel Buerke, Jens Dr. Hahn, Sven Schmidbauer. Applicant, Infineon Technologies AG. Export Citation, BiBTeX, EndNote, RefMan. Classifications (10) ...
DE B4 - Verfahren zum Füllen von KontaktlöchernInventors, Axel Buerke, Jens Hahn, Andreas Klipp, Sven Schmidbauer, Norbert Urbansky, Detlef Weber. Applicant, Infineon Technologies Ag. Export Citation ...
EP A1 - Method of generating real-time stereo images of...Two image signals are produced from each scanning point by turning the particle beam of the microscope by an angle +phi or -phi to the sample normal at...
SpringerCitations - Details PageSven Schmidbauer, Jens Hahn, Axel Buerke, Frank Jakubowski, Olaf Storbeck, Yu-Wei Ting, Thomas Schuster and Jürgen Faul. Journal: Microelectronic ...
Bedeutung zum Vornamen Axel
Männlicher Vorname (Deutsch, Skandinavisch): Axel; (Gott-)Vater ist der Friede; Hebräisch (Altes Testament); ab = der Vater; shalom = der Friede; in der Bibel ist Absalom der dritte Sohn Davids
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